Publications and Conference Presentations by David C. Trindade, Ph.D.
Texts
Applied Reliability, 2nd ed., co-authored with Paul Tobias, 1995, Chapman &Hall/ CRC
Design of Experiments, An Overview for Managers, 1991, Council for Continuous Improvement (CCI)
“Field Data Analysis for Repairable Systems: Status and Industry Trends”, co-authored with Swami Nathan in Handbook of Performability Engineering, K.B. Misra (ed.), 2008, Springer
Technical Publications and Reports
"Estimation of the reliability of computer components from field renewal data," 1980, Microelectronics and Reliability, co-authored with Dr. Larry Haugh
Reliability, 1987, Advanced Micro Devices Quality and Reliability Brochure
Reliability, 1986, Advanced Micro Devices Quality and Reliability Brochure
"Can Burn-In Screen Wearout Mechanisms? Reliability Modeling of Defective Subpopulations - A Case Study," 1991, 29th Annual Proceedings of the Reliability Physics Symposium
"The Successful Road to SPC- Avoiding the Potholes," 1989, Proceedings of the Technical Program, National Electronic Packaging and Production Conference (NEPCON)
"Simulating Reliability Distributions in APL," 1980, Proceedings of the American Institute for Decision Sciences
"An APL Program to Numerically Differentiate Data by the Ruler Method," 1975, IBM Technical Report TR 19.0361
"Simulating Reliability Distributions in APL," 1978, IBM TR 19.0451
"Nonparametric Estimation of a Lifetime Distribution via the Renewal Function," 1979, co-authored with Dr. Larry Haugh, IBM Technical Report TR 19.0463
"Estimation of the Reliability of Computer Components from Field Renewal Data," 1979, co-authored with Dr. Larry Haugh, IBM Technical Report, TR19.0488
"An APL Solution to a Tridiagonal System of Linear Equations," 1978, IBM Technical Report, TR190456
"Two APL Programs for the Gehan-Wilcoxon Test to Nonparametrically Compare Censored Reliability Data," 1979, IBM TR 19.0480
"Propagation of Error in Accelerated Stressing," 1975, IBM Technical Report, TR 19.0353
"Mathematical Development of an Empirical Gate Short Model," 1975, IBM Technical Report TR 19.0345
"FET CPI, CPF and FSU Reliability Models," 1974, IBM Technical Report TR 19.0327
There are also more than thirty publications for IBM, GI, AMD, and SUN internal technical and statistical conferences. The topics have included reliability models, renewal processes, minimum size sampling plans, regression analysis of covariance, EVOP, split-plot designs, and other statistical techniques. In addition, externally there have been eleven presentations at ASA Annual meetings and over twenty-five papers presented at various other external conferences, such as ASQC, IRPS, NEPCON, SEMICON, SEMATECH Workshops, INFORMS, 7x24 Exchange, and CCI. Recent examples are listed below.
Conference Presentations and Tutorials
The Sphere of Excellence, 1983, General Instrument Quality and Reliability Brochure
"Nonparametric Estimation of a Reliability Function in Multicensored Life Testing with Unidentified Replacement of Failed Items," co-authored with Dr. Larry Haugh, American Statistical Association Annual Joint Meetings, 1976, Boston
“Arrow Charts: A New Way of Displaying Multiple Comparison Data” American Statistical Association Annual Joint Meetings, 1993, San Francisco
“The Reverse Arrangement Test: A Simple Procedure for Detecting Trends in Repairable System Reliability,” SEMATECH 1995 Applied Reliability Tools Workshop (ARTWORK VIII) in Boston
“Multivariate Process Control with Radar Charts,” SEMATECH 1996 Statistical Methods Symposium on Multivariate Methods in the Semiconductor Industry in San Antonio
“Computer Simulation of Repairable Processes,” SEMATECH 1996 Applied Reliability Tools Workshop (ARTWORK IX) in Santa Fe
“Components of Variance and Nested Factorial Designs,” First International Metrology Conference, 1996, Honolulu
“Survey Data: Use of Scatter Plots for Displaying Scale and Consistency Factors” American Statistical Association Annual Joint Meetings, 1995, Orlando
“Confirming Trends in Repairable Systems,” American Statistical Association Annual Joint Meetings, 1996, Chicago
“An Overview of Applied Reliability,” Council for Continuous Improvement (CCI) General Session, 1996, Oakland
“Regression Models for a Binary Response Using EXCEL and JMP,” SEMATECH Statistical Methods Group Symposium, 1997, Austin, TX
“An Introduction to Logistic Regression,” American Society of Quality, Santa Clara Chapter, 1997
“Reliability and Availability Modeling of Repairable Systems,” 2000, Sun Technology Leadership Conference, Santa Clara, CA
“Reliability IS Time Dependent,” 2002, Sun Technology Leadership Conference, Santa Clara, CA
“Simple Plots for Monitoring Field Reliability”, Applied Reliability Symposium, 2005, San Diego, CA
“Making Sense of Data: Excel Analysis Tools (A Tutorial)”, Council for Continuous Improvement General Session, April 1997, San Jose, CA
“Simple Plots for Monitoring the Field Reliability of Repairable Systems”, RAMS, January 2005, Alexandria, VA
“Analysis of Field Data for Repairable Systems”, Tutorial, RAMS, 2006, Orlando, FL
“Analysis of Field Data for Repairable Systems”, 7x24 Exchange Conference, October 2006, Scottsdale, AZ
“Analysis of Field Data for Repairable Systems”, Tutorial, RAMS, 2007, Newport Beach, CA
“Analysis of Field Data for Repairable Systems”, Tutorial, RAMS, 2008, Las Vegas, NV
“Common Statistical Questions in Test Planning”, Test@Sun Conference, May 2007, Menlo Park
“Availability and Cost Monitoring in Datacenters Using Mean Cumulative Functions”, Joint Statistical Meetings, 2007, Salt Lake City
“Warranty Analysis of Repairable Systems”, Quality and Productivity Research Conference, June 2007, Santa Fe, NM
“Analysis of the Field Reliability of Repairable Systems”, INFORMS, July 2007, Puerto Rico
“How Reliable Are Sun Systems at My Customers’ Data Centers?” Sun Customer Engineering Conference (CEC), October 2007, Las Vegas
Patent Awards and Invention Disclosures
IBM: Patent 3,889,188, “Time Zero Determination of FET Reliability,” on June 10, 1975.
IBM: Technical invention disclosures:
March 1974 “Prediction of Failure Rate of Field-Effect Transistors”
August 1981, “Program to Numerically Differentiate Data”
August 1981, “Renewal Function Estimation”